摘要： •Electrical current stressing will diminish the XRD diffraction peaks of Sn9Zn alloy rapidly.•The kinetics of the diminishing of the crystalline peak follows a logarithmic law with respect to current density.•The diminishing of the XRD diffraction is believed to be a result of disruption of the crystal structure. The variations in the crystal structure of Sn9Zn alloy due to electrical current stressing were investigated with in situ synchrotron XRD analysis. The XRD (X-ray Diffraction) orientation peaks of both Sn and Zn crystals diminished rapidly upon current stressing. The behavior of peak diminishing indicated the electrodisruption of the crystal structure. The electrodisruption was correlated logarithmically to the strain, estimated from the XRD peak shift, as induced by current stressing. The peak diminishing of the Zn crystal was also ascribed to the electrodissolution of Zn in the Sn matrix as revealed by SEM image. 出版者： Elsevier B.V 出版日期： 2015-01-15 出處： Journal of alloys and compounds, 2015-01, Vol.619, p.372-377 版權： 2014 Elsevier B.V. 識別號： ISSN: 0925-8388 識別號： EISSN: 1873-4669 識別號： DOI: 10.1016/j.jallcom.2014.08.170
