摘要： The Solar Aspect Monitor (SAM) is a pinhole camera on the Extreme ultraviolet Variability Experiment (EVE) aboard the Solar Dynamics Observatory. SAM projects the solar disk onto the CCD through a metallic filter designed to allow only solar photons shortward of 7 nm to pass. Contamination from energetic particles and out‐of‐band irradiance is, however, significant in the SAM observations. We present a technique for isolating the 0.01–7 nm integrated irradiance from the SAM signal to produce the first results of broadband irradiance for the time period from May 2010 to May 2014. The results of this analysis agree with a similar data product from EVE's EUV SpectroPhotometer to within 25%. We compare our results with measurements from the Student Nitric Oxide Explorer Solar X‐ray Photometer and the Thermosphere Ionosphere Mesosphere Energetics and Dynamics Solar EUV Experiment at similar levels of solar activity. We show that the full‐disk SAM broadband results compared well to the other measurements of the 0.01–7 nm irradiance. We also explore SAM's capability toward resolving spatial contribution from regions of solar disk in irradiance and demonstrate this feature with a case study of several strong flares that erupted from active regions on 11 March 2011. Key Points Methods of removing particle contamination are proposed and analyzed Broadband soft X‐ray irradiance is derived and validated SAM is capable of resolving spatial and spectral irradiances 出版者： Washington: Blackwell Publishing Ltd 出版日期： 2016-04 出處： Journal of geophysical research : Space physics (2013 - Present), 2016-04, Vol.121 (4), p.3648-3664 資源來源： Wiley Online Library All Journals 版權： 2016. American Geophysical Union. All Rights Reserved. 識別號： ISSN: 2169-9380 識別號： EISSN: 2169-9402 識別號： DOI: 10.1002/2015JA021726
