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    Please use this identifier to cite or link to this item: https://ir.lib.ncu.edu.tw/handle/987654321/102796


    Title: Low-resistivity C54-TiSi2 as a sidewall-confinement nanoscale electrode for three-dimensional vertical resistive memory
    Authors: 楊伯康;Durán Retamal, José Ramón;Kang, Chen-Fang;Yang, Po-Kang;Lee, Chuan-Pei;Lien, Der-Hsien;Ho, Chih-Hsiang;He, Jr-Hau
    Contributors: 生醫理工學院生醫科學與工程學系
    Date: 2014-11-03
    Issue Date: 2026-04-23 11:16:56 (UTC+8)
    Publisher: American Institute of Physics
    Abstract: 出版日期: 2014-11-03
    出處: Applied physics letters, 2014-11, Vol.105 (18), p.182101
    資源來源: AIP Journals (American Institute of Physics)
    識別號: ISSN: 0003-6951
    識別號: EISSN: 1077-3118
    識別號: DOI: 10.1063/1.4901072
    Appears in Collections:[Department of Biomedical Sciences and Engineering ] journal & Dissertation

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