摘要： Due to the high attenuation in vitreous silica, acoustic attenuations in the THz regime are typically measured by incoherent techniques such as Raman, neutron, and X-ray scattering. Here, we utilized multiple-quantum-well structures to demonstrate acoustic spectroscopy of vitreous silica up to ∼740 THz. The acoustic properties of silica thin films prepared by physical and chemical deposition methods were characterized in the sub-THz regime. This technique can be useful in resolving debated issues relating to Boson peak around 1 THz. 出版者： AIP Publishing LLC 出版日期： 2013-07-01 出處： AIP advances, 2013-07, Vol.3 (7), p.072126-072126 資源來源： DOAJ Directory of Open Access Journals 版權： Author(s) 識別號： ISSN: 2158-3226 識別號： EISSN: 2158-3226 識別號： DOI: 10.1063/1.4816800 識別號： CODEN: AAIDBI
