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    NCU Institutional Repository > 理學院 > 物理學系 > 期刊論文 >  Item 987654321/104015


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    題名: Adsorption and desorption of thermally generated hydrogen atoms on Au(111) and Ag/Au(111)
    作者: 陸大安;Luh, Dah-An;Li, Kun-Rong;Huang, Ren-Yu;Chen, Ching-Hung;Cheng, Cheng-Maw;Tsuei, Ku-Ding;Wang, Chia-Hsin;Yang, Yaw-Wen
    貢獻者: 理學院物理學系
    關鍵詞: Angle-resolved photoemission spectroscopy;Annealing;Chemical composition;Contaminants;Desorption;Hydrogen adsorption and desorption;Metallic surfaces;Photoemission;Silver;Spectra;Surface chemistry;X-ray photoemission spectroscopy
    日期: 2015-01-01
    上傳時間: 2026-04-23 11:41:49 (UTC+8)
    出版者: Elsevier;Elsevier B.V
    摘要: 摘要: To explore the possibility of employing thermally generated H atoms to determine the chemical composition of a metallic surface, we investigated the adsorption and desorption of H atoms generated with a thermal cracker on surfaces Au(111) and Ag/Au(111). Angle-resolved photoemission spectra showed that the noble-metallic surfaces deteriorated upon exposure to a flux of H atoms at ~100K. Upon subsequent annealing, the order of the surfaces was mostly recovered when H atoms on the surfaces desorbed, but the recovery was incomplete even with annealing at a temperature much higher than that at which H atoms desorb. X-ray photoemission spectra showed that O-containing contaminants existed on the surfaces after the H dosing. The evolution of O 1s during annealing indicated that the O-containing contaminants were H2O and its moieties generated during thermal cracking; the disturbances of the surfaces remaining above the desorption temperature of H atoms were likely caused by chemisorbed O. Our results show that it is possible to employ thermally generated H atoms to determine the chemical composition of a metallic surface, but a small proportion of H2O in a H2 gas line might be unavoidable; precautions against possible O contamination are required when a thermal cracker is employed. •The noble-metallic surfaces dosed with thermally generated H atoms are studied.•The order of the H-dosed surfaces is not fully recovered after H atoms desorb.•O-containing contaminants are detected on the H-dosed surfaces.•The contaminants are water and its moieties generated with thermal cracking.•Precautions against O contamination are required when a thermal cracker is employed.
    出版者: Elsevier B.V
    出版日期: 2015-05-01
    出處: Surface science, 2015-05, Vol.635, p.11-18
    版權: 2014 Elsevier B.V.
    識別號: ISSN: 0039-6028
    識別號: EISSN: 1879-2758
    識別號: DOI: 10.1016/j.susc.2014.12.001
    顯示於類別:[物理學系] 期刊論文

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