Quality evaluation for microcrystalline silicon thin-film solar cells by single-layer absorption

Please use this identifier to cite or link to this item: https://ir.lib.ncu.edu.tw/handle/987654321/104072

Title:	Quality evaluation for microcrystalline silicon thin-film solar cells by single-layer absorption
Authors:	陳昇暉;Chen, Sheng-Hui;Chang, Ting-Wei;Wang, Hsuan-Wen
Contributors:	理學院光電科學與工程學系
Date:	2012-03-16
Issue Date:	2026-04-23 11:42:56 (UTC+8)
Publisher:	Hindawi Publishing Corporation;Cairo, Egypt: Hindawi Puplishing Corporation
Abstract:	摘要： The absorption coefficient at 1.4 eV is divided by the value at 0.9 eV to obtain the factor used to judge the quality of μc-Si:H. PV device performance can be predicted by multiplying Voc with Isc when using this layer as an intrinsic layer. The results show a good relationship between the quality factor and the product of open-circuit voltage and short-circuit current. However, the final efficiency is influenced by the identities of the interface in the multilayer structure. 出版者： Cairo, Egypt: Hindawi Puplishing Corporation 出版日期： 2012-01-01 出處： International journal of photoenergy, 2012-01, Vol.2012 (2012), p.1-5 資源來源：華藝線上圖書館版權： Copyright © 2012 Sheng-Hui Chen et al. 識別號： ISSN: 1110-662X 識別號： ISSN: 1687-529X 識別號： EISSN: 1687-529X 識別號： DOI: 10.1155/2012/653501
Appears in Collections:	[Department of Optics and Photonics] journal & Dissertation

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