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    請使用永久網址來引用或連結此文件: https://ir.lib.ncu.edu.tw/handle/987654321/104141


    題名: Revealing local, enhanced optical field characteristics of Au nanoparticle arrays with 10 nm gap using scattering-type scanning near-field optical microscopy
    作者: 張勝雄;Cheng, Tian-You;Wang, Hui-Hsien;Chang, Sheng Hsiung;Chu, Jen-You;Lee, Juen-Haw;Wang, Yuh-Lin;Wang, Juen-Kai
    貢獻者: 理學院光電科學與工程學系
    關鍵詞: Aluminum Oxide - chemistry;Arrays;Etching;Gold;Gold - chemistry;Metal Nanoparticles - chemistry;Microscopy, Atomic Force;Nanocomposites;Nanomaterials;Nanostructure;Optical microscopy;Scanning;Silicon - chemistry
    日期: 2013-03-28
    上傳時間: 2026-04-23 11:44:21 (UTC+8)
    出版者: Royal Society of Chemistry;England
    摘要: 摘要: Anomalous optical properties displayed by plasmonic structures are commonly attributed to the enhanced, local field within their corrugations. Though theoretical calculations of such field enhancements abound, experimental observations are relatively few, because only few optical microscopic techniques have enough spatial resolution. We used scattering-type scanning near-field optical microscopy to resolve local optical characteristics of a gold nanoparticle array with 10 nm gap between adjacent particles. Subnanometer-resolution measurement of the optical field intensity was achieved by use of etched silicon atomic force microscopy probe tip. The result shows that, with a p-polarized excitation scheme, the induced field is enhanced and the phase undergoes a large change in the gap region. The spatially-resolved signals are attributed to the electromagnetic interaction within an array of vertical dipoles. We show that scattering-type near-field optical microscopy is well-suited to the investigation of field enhancements in plasmon-enhanced sensing and spectroscopy array structures.
    其他題名: Phys Chem Chem Phys
    出版者: England
    出版日期: 2013-03-28
    出處: Physical chemistry chemical physics : PCCP, 2013-03, Vol.15 (12), p.4275-4282
    資源來源: Royal Society of Chemistry
    識別號: ISSN: 1463-9076
    識別號: ISSN: 1463-9084
    識別號: EISSN: 1463-9084
    識別號: DOI: 10.1039/c3cp43270j
    識別號: PMID: 23439965
    顯示於類別:[光電科學與工程學系] 期刊論文

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