中大機構典藏-NCU Institutional Repository-提供博碩士論文、考古題、期刊論文、研究計畫等下載:Item 987654321/10417
English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 78937/78937 (100%)
造訪人次 : 39444554      線上人數 : 404
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
搜尋範圍 查詢小技巧:
  • 您可在西文檢索詞彙前後加上"雙引號",以獲取較精準的檢索結果
  • 若欲以作者姓名搜尋,建議至進階搜尋限定作者欄位,可獲得較完整資料
  • 進階搜尋


    請使用永久網址來引用或連結此文件: http://ir.lib.ncu.edu.tw/handle/987654321/10417


    題名: 高增益低導通電壓銻砷化銦鎵異質接面雙極性電晶體之研製;Growth and characterization of InGaAsSb base DHBT with high current gain and low turn-on voltage
    作者: 張朝閔;Chao-Min Chang
    貢獻者: 電機工程研究所
    關鍵詞: 銻砷化銦鎵;少數載子生命週期;高電流增益/低片電阻比;minority carrier lifetime;InGaAsSb;high beta over sheet ratio
    日期: 2009-06-25
    上傳時間: 2009-09-22 12:16:11 (UTC+8)
    出版者: 國立中央大學圖書館
    摘要: 本論文主要研究銻砷化銦鎵(InGaAsSb)材料之磊晶成長技術及其材料特性,同時將其應用於磷化銦(InP)系列電晶體元件之基極。在雙異質接面雙極性電晶體中,藉由增加基極摻雜濃度能夠降低其片電阻(RSH)而提升高頻特性,然而此舉又會因為Auger process機率增加而降低其電流增益。對此問題我們藉由電晶體基極中的少數載子生命期,分析InGaAsSb材料中摻雜濃度對Auger process的影響。 本研究另一個重點為四元材料的成長。 我們發展出一套能夠成長InGaAsSb材料晶格匹配於InP基板上,又能夠任意調整Sb成分的成長技術。 藉由改變磊晶成長條件以及設計不同電晶體之結構用以研究元件特性與材料之關係。 在所製作的In0.52Al0.48As/In0.09Ga0.91As0.58Sb0.42/In0.53Ga0.47As DHBT上可以得到VBE=0.45 V的低導通電壓以及?/RSH=0.073的高電流增益/片電阻比,已與傳統InP DHBT之最佳結果相當。 This dissertation describes the material growth and characterization of InP-based heterojunction bipolar transistors (HBTs) with an InGaAsSb base layer, which have the advantages of low turn-on voltage and high current capability. High doping concentration in base to reduce the base sheet resistance is necessary for achieving high fMAX, but it might also result in decreased current gain and ?/RSH ratio due to the enhanced Auger process. To obtain more insights into the current behavior of InGaAsSb base DHBTs, doping effect on the electron lifetime (?n) is studied. In this research, we develop a growth technique for growing lattice- matched InGaAsSb on InP substrates with accurately controlled Sb composition. For a high Sb-content InGaAsSb layer, the amount of Ga is increased to complement the decreases of In while maintaining a constant growth rate and V/III ratio. In addition, the effects of Sb composition on the characteristics of InGaAsSb base DHBTs are investigated. The In0.52Al0.48As/ In0.09Ga0.91As0.58Sb0.42/In0.53Ga0.47As DHBT exhibits a low turn-on voltage of 0.45 V and a high ?/RSH ratio of 0.073, which is comparable to the state-of-the-art conventional InP DHBTs.
    顯示於類別:[電機工程研究所] 博碩士論文

    文件中的檔案:

    檔案 大小格式瀏覽次數


    在NCUIR中所有的資料項目都受到原著作權保護.

    社群 sharing

    ::: Copyright National Central University. | 國立中央大學圖書館版權所有 | 收藏本站 | 設為首頁 | 最佳瀏覽畫面: 1024*768 | 建站日期:8-24-2009 :::
    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - 隱私權政策聲明