摘要： A new method is introduced to evaluate the specific series resistance distribution of solar cells using photoluminescence images under both short circuit and open circuit conditions. An experiment was performed to confirm that method is insensitive to the illumination intensity distribution and valid for different illumination levels. 其他題名： Opt Express 出版者： United States 出版日期： 2012-11-05 出處： Optics express, 2012-11, Vol.20 (S6), p.A822 資源來源： Optica Publishing Group Journals 識別號： ISSN: 1094-4087 識別號： EISSN: 1094-4087 識別號： DOI: 10.1364/OE.20.00A822 識別號： PMID: 23187658
