Wavefront measurement made by an off-the-shelf laser-scanning pico projector

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题名:	Wavefront measurement made by an off-the-shelf laser-scanning pico projector
作者:	梁肇文;Chen, Jia-Wei;Liang, Chao-Wen;Chen, Sheng-Hui
贡献者:	理學院光電科學與工程學系
关键词:	Focal plane;Gaussian beams (optics);Interferometers;Scanning;Slopes;Test procedures;Wave fronts;Zernike polynomials
日期:	2015-10-01
上传时间:	2026-04-23 11:50:29 (UTC+8)
出版者:	The Optical Society;United States
摘要:	摘要： Focal plane testing methods such as the Shack-Hartmann wavefront sensor and phase-shifting deflectometry are valuable tools for optical testing. In this study, we propose a novel wavefront slope testing method that uses a scanning galvo laser, in which a single-mode Gaussian beam scans the pupils of the tested optics in the system. In addition, the ray aberration is reconstructed by the four-step phase-shifting measurement by modulating the angular domain. The measured wavefront is verified by a Fizeau interferometer in terms of Zernike polynomials. 其他題名： Appl Opt 出版者： United States 出版日期： 2015-10-01 出處： Applied Optics, 2015-10, Vol.54 (28), p.E235-E240 資源來源： Optica Publishing Group Journals 識別號： ISSN: 1559-128X 識別號： EISSN: 2155-3165 識別號： EISSN: 1539-4522 識別號： DOI: 10.1364/AO.54.00E235 識別號： PMID: 26479659
显示于类别:	[光電科學與工程學系] 期刊論文

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