Fluctuations of entropy production in partially masked electric circuits

Please use this identifier to cite or link to this item: https://ir.lib.ncu.edu.tw/handle/987654321/104750

Title:	Fluctuations of entropy production in partially masked electric circuits
Authors:	陳永富;Chiang, Kuan-Hsun;Chou, Chia-Wei;Lee, Chi-Lun;Lai, Pik-Yin;Chen, Yung-Fu
Contributors:	理學院物理學系
Keywords:	05.40.-a;05.70.Ln;Circuits;Coupling;Descriptions;Dynamics;Entropy;Fluctuation;Joining;RC circuits;Time
Date:	2016-02-01
Issue Date:	2026-04-23 11:57:15 (UTC+8)
Publisher:	IOP Publishing Ltd.;Les Ulis: EDP Sciences, IOP Publishing and Societ� Italiana di Fisica
Abstract:	摘要： We experimentally investigate fluctuations of entropy production in a coupled driven-RC circuit. In particular, we focus on the hidden-variable problem, where part of the circuit is neglected intentionally. In the two versions of the reduced descriptions we provide for the system, the fluctuation theorem (FT) is valid in all timescales for weak coupling. However, FT fails in the strong-coupling regime, in the short-time limit for one version, and in the long-time limit for the other. In these timescales where FT fails, both descriptions still give FT-like behavior. The failure of FT implies non-Markovian dynamics, meaning there exists a hidden variable that cannot be incorporated into the heat bath. We argue that FT can be restored with the introduction of a timescale-dependent effective noise. 其他題名： EPL 出版者： Les Ulis: EDP Sciences, IOP Publishing and Società Italiana di Fisica 出版日期： 2016-02-01 出處： Europhysics letters, 2016-02, Vol.113 (3), p.30001-30001 資源來源： Institute of Physics Journals 版權： Copyright © EPLA, 2016 識別號： ISSN: 0295-5075 識別號： EISSN: 1286-4854 識別號： DOI: 10.1209/0295-5075/113/30001 識別號： CODEN: EULEEJ
Appears in Collections:	[Department of Physics] journal & Dissertation

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