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    Please use this identifier to cite or link to this item: https://ir.lib.ncu.edu.tw/handle/987654321/105043


    Title: Ultra-low-edge-defect graphene nanoribbons patterned by neutral beam
    Authors: 蘇清源;Huang, Chi-Hsien;Su, Ching-Yuan;Okada, Takeru;Li, Lain-Jong;Ho, Kuan-I;Li, Pei-Wen;Chen, Inn-Hao;Chou, Chien;Lai, Chao-Sung;Samukawa, Seiji
    Contributors: 工學院能源工程研究所
    Keywords: Applied sciences;Arrays;Carbon;Chemical vapor deposition (including plasma-enhanced cvd, mocvd, etc.);Cross-disciplinary physics: materials science;rheology;Electronics;Etching;Exact sciences and technology;Graphene;image analysis;Lithography;Materials science;Methods of deposition of films and coatings;film growth and epitaxy;Nanocomposites;Nanomaterials;Nanostructure;Neutral beams;oxygen;Physics;Plasma etching;Raman spectroscopy;Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices;Surface treatments;temperature;Transistors
    Date: 2013-09-01
    Issue Date: 2026-04-23 12:04:59 (UTC+8)
    Publisher: Elsevier Ltd.;Kidlington: Elsevier Ltd
    Abstract: 摘要: Top-down process, comprising lithography and plasma etching is widely used in very-large-scale integration due to its scalability, has the greatest potential to fabricate graphene nanoribbon based nanoelectronic devices for large-scale intergraded circuits. However, conventional plasma etching inevitably introduces plenty of damage or defects to the etched materials, which drastically degrades the performance of nano materials. In this study, extremely low-damage neutral beam etching (NBE) is applied to fabricate ultra-low-defect graphene nanoribbon array (GNR). The ultra-low-edge-defect GNRs are fabricated by E-beam lithography followed by oxygen NBE from large-scale chemical-vapor-deposition-grown graphene. AFM images clearly shows the GNRs patterned by NBE and E-beam lithography, and Raman spectroscopy exhibits extremely low ID/IG of GNRs, which indicate that high-quality GNRs can be successfully fabricated by neutral beam. We also demonstrated bottom-gated field-effect transistor with the high-quality GNR and observed a high carrier mobility (>200cm2V−1s−1) at room temperature.
    出版者: Kidlington: Elsevier Ltd
    出版日期: 2013-09-01
    出處: Carbon, 2013-09, Vol.61, p.229-235
    資源來源: Elsevier ScienceDirect Journals Complete - Autoholdings
    版權: 2013 Elsevier Ltd
    版權: 2014 INIST-CNRS
    識別號: ISSN: 0008-6223
    識別號: EISSN: 1873-3891
    識別號: DOI: 10.1016/j.carbon.2013.04.099
    識別號: CODEN: CRBNAH
    Appears in Collections:[Energy of Mechatronics] journal & Dissertation

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