On the nature of defects created on graphene by scanning probe lithography under ambient conditions

Please use this identifier to cite or link to this item: https://ir.lib.ncu.edu.tw/handle/987654321/105555

Title:	On the nature of defects created on graphene by scanning probe lithography under ambient conditions
Authors:	溫偉源;Chien, Hsiao-Mei;Chuang, Min-Chiang;Tsai, Hung-Chieh;Shiu, Hung-Wei;Chang, Lo-Yueh;Chen, Chia-Hao;Lee, Sheng-Wei;White, Jonathon David;Woon, Wei-Yen
Contributors:	理學院物理學系
Keywords:	atomic force microscopy;Carbon;Chemical vapor deposition (including plasma-enhanced cvd, mocvd, etc.);Cross-disciplinary physics: materials science;rheology;Defects;Depression;Electric potential;Exact sciences and technology;Graphene;graphene oxide;Lithography;Materials science;Methods of deposition of films and coatings;film growth and epitaxy;Physics;Reconstruction;Scanning;spectroscopy
Date:	2014-01-01
Issue Date:	2026-04-23 12:36:06 (UTC+8)
Publisher:	Elsevier Ltd.;Kidlington: Elsevier Ltd
Abstract:	摘要： The defects created by scanning probe lithography (SPL) under ambient conditions in CVD grown graphene were investigated using atomic force microscopy, micro-Raman (μ-RS) and micro-X-ray photoelectron spectroscopy (μ-XPS). Topographically, both protrusion and depression structures with distinguishable tribological properties were produced simultaneously. However, the key aspects of the spectroscopy were similar for the two topographies. μ-RS revealed that the ratio of the defect Raman peaks (ID/ID′) and the effective distance between defects (LD) had similar magnitude and dependence on the applied bias voltage. μ-XPS revealed no evidence of the generation of sp3-type defects. The small amplitude of the C–O peak and absence of CO and C–OH peaks, suggested a complete absence of graphene oxide in the defect areas. Our results indicate that similar defects are present in both depressions and protrusions and suggest that a common active mechanism, namely bond reconstruction, is responsible for both structures. 出版者： Kidlington: Elsevier Ltd 出版日期： 2014-12-01 出處： Carbon (New York), 2014-12, Vol.80, p.318-324 資源來源： Elsevier ScienceDirect Journals Complete 版權： 2014 Elsevier Ltd 版權： 2015 INIST-CNRS 識別號： ISSN: 0008-6223 識別號： EISSN: 1873-3891 識別號： DOI: 10.1016/j.carbon.2014.08.070 識別號： CODEN: CRBNAH
Appears in Collections:	[Department of Physics] journal & Dissertation

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