A comparison of normal approximation rules for attribute control charts

Please use this identifier to cite or link to this item: https://ir.lib.ncu.edu.tw/handle/987654321/105672

Title:	A comparison of normal approximation rules for attribute control charts
Authors:	江村剛志;Emura, Takeshi;Lin, Yi-Shuan
Contributors:	理學院統計研究所
Keywords:	Approximation;attribute control chart;binomial distribution;Binomials;Control charts;Defects;Loans;Mathematical analysis;np-chart;p-chart;Semiconductors;Statistical methods;statistical process control
Date:	2015-04-01
Issue Date:	2026-04-23 12:46:58 (UTC+8)
Publisher:	John Wiley and Sons Ltd;Bognor Regis: Blackwell Publishing Ltd
Abstract:	摘要： Control charts, known for more than 80 years, have been important tools for business and industrial manufactures. Among many different types of control charts, the attribute control chart (np‐chart or p‐chart) is one of the most popular methods to monitor the number of observed defects in products, such as semiconductor chips, automobile engines, and loan applications. The attribute control chart requires that the sample size n is sufficiently large and the defect rate p is not too small so that the normal approximation to the binomial works well. Some rules for the required values for n and p are available in the textbooks of quality control and mathematical statistics. However, these rules are considerably different, and hence, it is less clear which rule is most appropriate in practical applications. In this paper, we perform a comparison of five frequently used rules for n and p required for the normal approximation to the binomial. With this result, we also refine the existing rules to develop a new rule that has a reliable performance. Datasets are analyzed for illustration. Copyright © 2013 John Wiley & Sons, Ltd. 其他題名： Qual. Reliab. Engng. Int 出版者： Bognor Regis: Blackwell Publishing Ltd 出版日期： 2015-04 出處： Quality and Reliability Engineering International, 2015-04, Vol.31 (3), p.411-418 資源來源： Wiley Online Library - AutoHoldings Journals 版權： Copyright © 2013 John Wiley & Sons, Ltd. 版權： Copyright © 2015 John Wiley & Sons, Ltd. 識別號： ISSN: 0748-8017 識別號： EISSN: 1099-1638 識別號： DOI: 10.1002/qre.1601 識別號： CODEN: QREIE5
Appears in Collections:	[Graduate Institute of Statistics] journal & Dissertation

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