Accelerated life tests of a series system with masked interval data under exponential lifetime distributions

Please use this identifier to cite or link to this item: https://ir.lib.ncu.edu.tw/handle/987654321/105702

Title:	Accelerated life tests of a series system with masked interval data under exponential lifetime distributions
Authors:	樊采虹;Fan, Tsai-Hung;Hsu, Tsung-Ming
Contributors:	理學院統計研究所
Keywords:	Accelerated life tests;Bayesian analysis;Bayesian methods;Computer simulation;Data models;expectation-maximization algorithm;interval data;Intervals;Life estimation;Markov chain Monte Carlo;masked data;Masking;Mathematical analysis;Mathematical models;Maximum likelihood estimation;Monte Carlo simulation;parametric bootstrap;Reliability;series system;Standard error;Stress;Studies
Date:	2012-08-07
Issue Date:	2026-04-23 12:48:26 (UTC+8)
Publisher:	Institute of Electrical and Electronics Engineers Inc.;New York: IEEE
Abstract:	摘要： We will discuss the reliability analysis of a series system under accelerated life tests when interval data are observed, while the components are assumed to have statistically independent exponential lifetime distributions. In a series system, the system fails if any of the components fails. It is common to include masked data in which the component that causes failure of the system is not observed. First, we apply the maximum likelihood approach via the expectation-maximization algorithm, and use the parametric bootstrap method for the standard error estimation. When the proportion of the masking data is high, the maximum likelihood approach fails due to lack of information. A Bayesian approach is an appropriate alternative in such a case. Hence, we also study the Bayesian approach incorporated with a subjective prior distribution with the aid of the Markov chain Monte Carlo method. We derive statistical inference on the model parameters, as well as the mean lifetimes, and the reliability functions of the system and components. The proposed method is illustrated through a numerical example simulated from the underlying model under various masking levels. 其他題名： TR 出版者： New York: IEEE 出版日期： 2012-09-01 出處： IEEE transactions on reliability, 2012-09, Vol.61 (3), p.798-808 資源來源： IEEE Electronic Library (IEL) 版權： Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Sep 2012 識別號： ISSN: 0018-9529 識別號： EISSN: 1558-1721 識別號： DOI: 10.1109/TR.2012.2209259 識別號： CODEN: IERQAD
Appears in Collections:	[Graduate Institute of Statistics] journal & Dissertation

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