摘要： We will discuss the reliability analysis of a series system under the step-stress accelerated lifetime test with Type-I censoring scheme while the components are assumed to have independent and non-identical Weibull lifetime distributions and the lifetime of each component all follows the cumulative exposure model. In many cases, the exact component causing the failure of the system cannot be identified and the cause of failure is masked. We adopt the log-linear relationship between the stress variables and the Weibull scale parameters and apply the Bayesian analysis from masked system life data when the probability of masking is dependent on different components. Further, the reliability of the system and components are estimated under usual operating conditions. The proposed method is illustrated through a simulation study. 出版者： Taylor & Francis 出版日期： 2013 出處： Quality technology & quantitative management, 2013, Vol.10 (3), p.291-303 版權： 2013 Taylor and Francis Group LLC 2013 識別號： ISSN: 1684-3703 識別號： EISSN: 1684-3703 識別號： DOI: 10.1080/16843703.2013.11673415
