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    Please use this identifier to cite or link to this item: https://ir.lib.ncu.edu.tw/handle/987654321/105881


    Title: Reliability Inference for a Copula-Based Series System Life Test under Multiple Type-I Censoring
    Authors: 樊采虹;Hsu, Tsung-Ming;Emura, Takeshi;Fan, Tsai-Hung
    Contributors: 理學院統計研究所
    Keywords: Algorithms;Clayton copula;Computer simulation;Correlation;Data models;EM algorithm;Failure times;Inference;log-location-scale family;Log-normal distribution;masked data;Mathematical model;Mathematical models;Maximum likelihood estimates;Maximum likelihood estimation;missing information principle;Reliability;series system;Service life assessment;type-I censoring
    Date: 2016-06-01
    Issue Date: 2026-04-23 12:58:59 (UTC+8)
    Publisher: Institute of Electrical and Electronics Engineers Inc.;New York: IEEE
    Abstract: 摘要: In this paper, we consider a multiple Type-I censored life test of series systems in which each component's lifetime belongs to the log-location-scale family of distributions with dependence. The dependence among lifetimes of components is generated by the Clayton copula with unknown copula parameter. We obtain the maximum likelihood estimates of the underlying parameters via EM algorithm under masked data and derive the Fisher information via missing information principle. The effect due to misspecification by independent models is investigated through the percentiles estimation of both the system's and components' failure time distributions by simulation study as well as a real data example.
    其他題名: TR
    出版者: New York: IEEE
    出版日期: 2016-06-01
    出處: IEEE Transactions on Reliability, 2016-06, Vol.65 (2), p.1069-1080
    資源來源: IEEE Electronic Library (IEL)
    版權: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2016
    識別號: ISSN: 0018-9529
    識別號: EISSN: 1558-1721
    識別號: DOI: 10.1109/TR.2016.2515589
    識別號: CODEN: IERQAD
    Appears in Collections:[Graduate Institute of Statistics] journal & Dissertation

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