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    Please use this identifier to cite or link to this item: https://ir.lib.ncu.edu.tw/handle/987654321/106369


    Title: A low-power ternary content addressable memory with Pai-Sigma matchlines
    Authors: 李進福;Yang, Shun-Hsun;Huang, Yu-Jen;Li, Jin-Fu
    Contributors: 資訊電機學院電機工程學系
    Keywords: Applied sciences;Associative memory;Computer architecture;Content addressable memories (CAM);Delay;Design. Technologies. Operation analysis. Testing;Electronics;Exact sciences and technology;Integrated circuits;Integrated circuits by function (including memories and processors);Layout;Logic gates;low power;Low-power electronics;Magnetic and optical mass memories;MOSFETs;networking;Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices;Storage and reproduction of information;ternary CAM (TCAM)
    Date: 2012-01-01
    Issue Date: 2026-04-23 13:18:57 (UTC+8)
    Publisher: Institute of Electrical and Electronics Engineers Inc.;New York, NY: IEEE
    Abstract: 摘要: This paper proposes a Pai-Sigma matchline scheme to reduce the compare (search) power of a ternary content addressable memory (TCAM). The proposed matchline does not incur the issues of charge sharing and short circuit current, which typically exist in the hybrid nand-nor matchline. Moreover, the switching activity of the search lines of a TCAM with the proposed matchlines is low. A 32×64-bit TCAM with the Pai-Sigma matchlines is implemented to demonstrate the low-power feature. Results show that the compare power of the TCAM can achieve 60% energy reduction compared with the conventional nor-type TCAM. Also, the energy consumption per bit per search of the TCAM is only 2.287 fJ/bit/search.
    其他題名: TVLSI
    出版者: New York, NY: IEEE
    出版日期: 2012-10-01
    出處: IEEE transactions on very large scale integration (VLSI) systems, 2012-10, Vol.20 (10), p.1909-1913
    資源來源: IEEE Electronic Library (IEL)
    版權: 2015 INIST-CNRS
    識別號: ISSN: 1063-8210
    識別號: EISSN: 1557-9999
    識別號: DOI: 10.1109/TVLSI.2011.2163205
    識別號: CODEN: IEVSE9
    Appears in Collections:[Department of Electrical Engineering] journal & Dissertation

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