Acoustic spectroscopy for studies of vitreous silica up to 740 GHz

NCUIR > College of Electrical Engineering & Computer Science > Department of Electrical Engineering > journal & Dissertation > Item 987654321/106507

Please use this identifier to cite or link to this item: https://ir.lib.ncu.edu.tw/handle/987654321/106507

Title:	Acoustic spectroscopy for studies of vitreous silica up to 740 GHz
Authors:	許晉瑋;Lin, Kung-Hsuan;Tsai, Dzung-Han;Wang, Kuan-Jen;Chen, Sheng-Hui;Chi, Kai-Lun;Shi, Jin-Wei;Chen, Po-Cheng;Sheu, Jinn-Kong
Contributors:	資訊電機學院電機工程學系
Keywords:	Acoustics;Attenuation;Bosons;Deposition;Spectroscopy;Thin films;Vitreous silica;X-rays
Date:	2013-08-26
Issue Date:	2026-04-23 13:25:39 (UTC+8)
Publisher:	AIP Publishing LLC
Abstract:	摘要： Due to the high attenuation in vitreous silica, acoustic attenuations in the THz regime are typically measured by incoherent techniques such as Raman, neutron, and X-ray scattering. Here, we utilized multiple-quantum-well structures to demonstrate acoustic spectroscopy of vitreous silica up to ∼740 THz. The acoustic properties of silica thin films prepared by physical and chemical deposition methods were characterized in the sub-THz regime. This technique can be useful in resolving debated issues relating to Boson peak around 1 THz. 出版者： AIP Publishing LLC 出版日期： 2013-07-01 出處： AIP advances, 2013-07, Vol.3 (7), p.072126-072126 資源來源： DOAJ Directory of Open Access Journals 版權： Author(s) 識別號： ISSN: 2158-3226 識別號： EISSN: 2158-3226 識別號： DOI: 10.1063/1.4816800 識別號： CODEN: AAIDBI
Appears in Collections:	[Department of Electrical Engineering] journal & Dissertation

Files in This Item:

File	Description	Size	Format
index.html		0Kb	HTML	22	View/Open

社群 sharing