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    Please use this identifier to cite or link to this item: https://ir.lib.ncu.edu.tw/handle/987654321/106637


    Title: Application of Total Internal Reflection and Heterodyne Interferometry in Electrical Conductivity Measurements
    Authors: 王文俊;Chiu, Jyh-Shyan;Wang, Shinn-Fwu;Wang, Wen-June;Huang, Bo-Shun;Lai, Wesley;Chang, Yu-Jing
    Contributors: 資訊電機學院電機工程學系
    Keywords: Additives;electrical conductivity (EC);Electrical resistivity;Electrodes;Fertilizers;heterodyne interferometry (HI);Interferometry;Light Emitting Diode (LED);Nitrogen;Nutrients;Optical interferometry;plant factory;Power plants;Refractive index;Resistivity;Sensitivity;Sensors;total internal reflection (TIR)
    Date: 2016-01-15
    Issue Date: 2026-04-23 13:32:46 (UTC+8)
    Publisher: Institute of Electrical and Electronics Engineers Inc.;New York: IEEE
    Abstract: 摘要: The studies conducted on light emitting diode plant factories have mostly adopted hydroponics for convenient nutrient management and pest and disease prevention. In particular, in nutrient management, liquid electrolytes can be measured to determine the aqueous nutrient concentrations and absorption rates as well as electrical conductivity (EC) and pH variations. Precisely controlling the aqueous nutrient contents is crucial to large-scale healthy plant production. However, in most of the current conductivity measurements, electrodes are adopted for determining the nutrient additive concentrations. This approach can be problematic in some cases, such as low electrode sensitivity, which results in nutrient overdose, specifically in nonconductive additives, and hinders plant growth. Therefore, this paper proposes an optical method for measuring the aqueous nutrient contents. In this method, the high sensitivity of common-path heterodyne interferometry is incorporated into aqueous measurements to prevent errors caused by interfering impurities on the electrodes and improve measurement and analytical accuracy. The sensitivity of the sensor used in EC measurements can reach 2300°/mS · cm -1 . The method has some merits, e.g., a simple optical setup, high stability etc., high measurement accuracy, high resolution, rapid measurement, and easy operation. In addition, its feasibility is demonstrated.
    其他題名: JSEN
    出版者: New York: IEEE
    出版日期: 2016-01-15
    出處: IEEE sensors journal, 2016-01, Vol.16 (2), p.336-342
    資源來源: IEEE Electronic Library (IEL)
    版權: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Jan 2016
    識別號: ISSN: 1530-437X
    識別號: EISSN: 1558-1748
    識別號: DOI: 10.1109/JSEN.2015.2480887
    識別號: CODEN: ISJEAZ
    Appears in Collections:[Department of Electrical Engineering] journal & Dissertation

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