Design of an error detection and data recovery architecture for motion estimation testing applications

NCUIR > College of Electrical Engineering & Computer Science > Department of Electrical Engineering > journal & Dissertation > Item 987654321/106969

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Title:	Design of an error detection and data recovery architecture for motion estimation testing applications
Authors:	許鈞瓏;Cheng, Chang-Hsin;Liu, Yu;Hsu, Chun-Lung
Contributors:	資訊電機學院電機工程學系
Keywords:	Acceptability;Applied sciences;Area overhead;Circuit faults;Circuit properties;Circuit synthesis;Coding;Computer architecture;Data recovery;Design engineering;Design. Technologies. Operation analysis. Testing;Electric, optical and optoelectronic circuits;Electronic circuits;Electronics;Error detection;Exact sciences and technology;Focusing;Integrated circuit modeling;Integrated circuits;Integrated circuits by function (including memories and processors);Mathematical model;motion estimation;Pixel;reliability;residue-and-quotient (RQ) code;Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices;Signal convertors;Testing;Time measurements;Very large scale integration
Date:	2012-04-01
Issue Date:	2026-04-23 13:50:48 (UTC+8)
Publisher:	Institute of Electrical and Electronics Engineers Inc.;New York, NY: IEEE
Abstract:	摘要： Given the critical role of motion estimation (ME) in a video coder, testing such a module is of priority concern. While focusing on the testing of ME in a video coding system, this work presents an error detection and data recovery (EDDR) design, based on the residue-and-quotient (RQ) code, to embed into ME for video coding testing applications. An error in processing elements (PEs), i.e. key components of a ME, can be detected and recovered effectively by using the proposed EDDR design. Experimental results indicate that the proposed EDDR design for ME testing can detect errors and recover data with an acceptable area overhead and timing penalty. Importantly, the proposed EDDR design performs satisfactorily in terms of throughput and reliability for ME testing applications. 其他題名： TVLSI 出版者： New York, NY: IEEE 出版日期： 2012-04-01 出處： IEEE transactions on very large scale integration (VLSI) systems, 2012-04, Vol.20 (4), p.665-672 資源來源： IEEE Electronic Library (IEL) 版權： 2015 INIST-CNRS 版權： Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Apr 2012 識別號： ISSN: 1063-8210 識別號： EISSN: 1557-9999 識別號： DOI: 10.1109/TVLSI.2011.2109972 識別號： CODEN: IEVSE9
Appears in Collections:	[Department of Electrical Engineering] journal & Dissertation

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