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    請使用永久網址來引用或連結此文件: https://ir.lib.ncu.edu.tw/handle/987654321/107178


    題名: Estimation Method for Statistical Eye Diagram in a Nonlinear Digital Channel
    作者: 周求致;Chou, Chiu-Chih;Hsu, Sheng-Yun;Wu, Tzong-Lin
    貢獻者: 資訊電機學院電機工程學系
    關鍵詞: Bit error rate;Bit error rate (BER);Central processing units;Channel estimation;channel evaluation;Channels;Convolution;Digital;Electromagnetic compatibility;Estimation;eye diagram prediction;Eyes;Jitter;nonlinear driver;Nonlinearity;Probability;Probability density function;signal integrity;Topology;Transmission
    日期: 2015-12-01
    上傳時間: 2026-04-23 13:58:57 (UTC+8)
    出版者: Institute of Electrical and Electronics Engineers Inc.;New York: IEEE
    摘要: 摘要: An estimation method for statistical eye diagram in a digital channel with nonlinear circuitry is proposed, which is based on the superposition of multiple bit pattern responses method. The proposed method captures the nonlinear effects in the channel by using 2 m bit pattern responses as bases for doing superposition. By selecting a larger m, the nonlinear performance of the channel can be captured more accurately. Besides the statistical eye diagram, a corresponding bathtub curve computing method is also proposed, which not only gives the total bit error rate (BER) distribution, but also the BER when transmitting a logic "1" signal and the BER of transmitting "0." The proposed method is verified using two different channel topologies: the push-pull output driver and the open-drain output driver. The predicted results are in agreement with the result of PRBS, while the CPU time of this method is much less than PRBS.
    其他題名: TEMC
    出版者: New York: IEEE
    出版日期: 2015-12-01
    出處: IEEE Transactions on Electromagnetic Compatibility, 2015-12, Vol.57 (6), p.1655-1664
    資源來源: IEEE Electronic Library (IEL)
    版權: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2015
    識別號: ISSN: 0018-9375
    識別號: EISSN: 1558-187X
    識別號: DOI: 10.1109/TEMC.2015.2457928
    識別號: CODEN: IEMCAE
    顯示於類別:[Department of Electrical Engineering] journal & Dissertation

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