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    Please use this identifier to cite or link to this item: https://ir.lib.ncu.edu.tw/handle/987654321/107282


    Title: GaAsSb bandgap, surface fermi level, and surface state density studied by photoreflectance modulation spectroscopy
    Authors: 綦振瀛;Hwang, J. S.;Tsai, J. T.;Su, I. C.;Lin, H. C.;Lu, Y. T.;Chiu, P. C.;Chyi, J. I.
    Contributors: 資訊電機學院電機工程學系
    Date: 2012-05-28
    Issue Date: 2026-04-23 14:05:23 (UTC+8)
    Publisher: American Institute of Physics
    Abstract: 摘要: The bandgap, surface Fermi level, and surface state density of a series of GaAs 1−x Sb x surface intrinsic-n + structures with GaAs as substrate are determined for various Sb mole fractions x by the photoreflectance modulation spectroscopy. The dependence of the bandgap on the mole composition x is in good agreement with previous measurements as well as predictions calculated using the dielectric model of Van Vechten and Bergstresser in Phys. Rev. B 1 , 3551 (1970). For a particular composition x, the surface Fermi level is always strongly pinned within the bandgap of GaAs 1−x Sb x and we find its variation with composition x is well described by a function E F =0.70−0.192x for 0≦x≦0.35, a result which is notably different from that reported by Chouaib [Appl. Phys. Lett. 93 , 041913 (2008)]. Our results suggest that the surface Fermi level is pinned at the midgap of GaAs and near the valence band of the GaSb.
    出版者: American Institute of Physics
    出版日期: 2012-05-28
    出處: Applied physics letters, 2012-05, Vol.100 (22), p.222104-222104-4
    資源來源: AIP Publishing
    版權: 2012 American Institute of Physics
    識別號: ISSN: 0003-6951
    識別號: EISSN: 1077-3118
    識別號: DOI: 10.1063/1.4724097
    識別號: CODEN: APPLAB
    Appears in Collections:[Department of Electrical Engineering] journal & Dissertation

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