Low-cost self-test techniques for small RAMs in SOCs using enhanced IEEE 1500 test wrappers

NCUIR > College of Electrical Engineering & Computer Science > Department of Electrical Engineering > journal & Dissertation > Item 987654321/107715

Please use this identifier to cite or link to this item: https://ir.lib.ncu.edu.tw/handle/987654321/107715

Title:	Low-cost self-test techniques for small RAMs in SOCs using enhanced IEEE 1500 test wrappers
Authors:	李進福;Huang, Yu-Jen;Li, Jin-Fu
Contributors:	資訊電機學院電機工程學系
Keywords:	Applied sciences;Built-in self-test;built-in self-test (BIST);Design. Technologies. Operation analysis. Testing;Diagnosis;Electronics;Exact sciences and technology;IEEE 1500;Integrated circuits;Integrated circuits by function (including memories and processors);multi-port RAM;Rams;Random access memory;random access memory (RAM);Reduction;Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices;Simulation;System-on-a-chip;system-on-chip (SOC);Test times;Testing, measurement, noise and reliability;Very large scale integration
Date:	2012-01-01
Issue Date:	2026-04-23 14:22:46 (UTC+8)
Publisher:	Institute of Electrical and Electronics Engineers Inc.;New York, NY: IEEE
Abstract:	摘要： This paper proposes an enhanced IEEE 1500 test wrapper to support the testing and diagnosis of the single-port or multi-port RAM core attached to the enhanced IEEE 1500 test wrapper without incurring large area overhead to small memories. Effective test time reduction techniques for the proposed test scheme are also proposed. Simulation results show that the additional area cost for implementing the enhanced IEEE 1500 test wrapper is only about 0.58% for a 64 K-bit single-port RAM and only 0.57% for a 64 K-bit two-port RAM in 90-nm technology. 其他題名： TVLSI 出版者： New York, NY: IEEE 出版日期： 2012-11-01 出處： IEEE transactions on very large scale integration (VLSI) systems, 2012-11, Vol.20 (11), p.2123-2127 資源來源： IEEE Electronic Library (IEL) 版權： 2015 INIST-CNRS 版權： Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Nov 2012 識別號： ISSN: 1063-8210 識別號： EISSN: 1557-9999 識別號： DOI: 10.1109/TVLSI.2011.2165568 識別號： CODEN: IEVSE9
Appears in Collections:	[Department of Electrical Engineering] journal & Dissertation

Files in This Item:

File	Description	Size	Format
index.html		0Kb	HTML	10	View/Open

社群 sharing

Loading...