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| 題名: | Measurement of interlayer screening length of layered graphene by plasmonic nanostructure resonances |
| 作者: | 辛正倫;Chen, Hsiang-An;Hsin, Cheng-Lun;Huang, Yu-Ting;Tang, Ming Lee;Dhuey, Scott;Cabrini, Stefano;Wu, Wen-Wei;Leone, Stephen R |
| 貢獻者: | 資訊電機學院電機工程學系 |
| 關鍵詞: | Applied sciences;Collective excitations (including excitons, polarons, plasmons and other charge-density excitations);Condensed matter: electronic structure, electrical, magnetic, and optical properties;Condensed matter: structure, mechanical and thermal properties;Cross-disciplinary physics: materials science;rheology;Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures;Electronics;Exact sciences and technology;Fullerenes and related materials;diamonds, graphite;Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties;Materials science;Physics;Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices;Specific materials;Surface and interface electron states;Surfaces and interfaces;thin films and whiskers (structure and nonelectronic properties);Transistors |
| 日期: | 2013-10-31 |
| 上傳時間: | 2026-04-23 14:23:14 (UTC+8) |
| 出版者: | American Chemical Society;Columbus, OH: American Chemical Society |
| 摘要: | 摘要: The variation in localized surface plasmon resonances of single Au nanodisks (diameter 100 nm and height 25 nm) on 0–13 graphene layers is investigated using dark-field scattering spectroscopy to obtain the graphene electric field screening length. For nanodisks (NDs) with and without underlying graphene layers on a SiO2 (300 nm)/Si substrate, the plasmon resonance red shifts from 604 to 620 nm with increasing graphene layers. The spectra of the plasmonic nanostructures obey an exponential saturation function versus increasing number of layers of graphene from 0 to 13. As a conducting film, the graphene layers screen the electric field generated by the plasmonic resonance of the Au NDs in the vicinity of the interface, and the red shifts of the resonance wavelength are explained in the framework of the electromagnetic field coupling between in-plane antiparallel image dipoles in the graphene layers and the ND dipole. A screening length of 1.2 ± 0.2 nm, equivalent to 3–4 graphene layers, is experimentally obtained, in good agreement with the measurement by field-effect transistors and theoretical calculation in doped graphene. The resonance shift of plasmonic nanostructures on a layered graphene system provides an alternative and convenient method for screening length measurement of graphene films. 其他題名: J. Phys. Chem. C 出版者: Columbus, OH: American Chemical Society 出版日期: 2013-10-31 出處: Journal of physical chemistry. C, 2013-10, Vol.117 (43), p.22211-22217 資源來源: American Chemical Society Publications 版權: Copyright © 2013 American Chemical Society 版權: 2015 INIST-CNRS 識別號: ISSN: 1932-7447 識別號: EISSN: 1932-7455 識別號: DOI: 10.1021/jp312363x |
| 顯示於類別: | [電機工程學系] 期刊論文
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