摘要： Single-shot ultrashort extreme-UV(EUV) pulse waveform measurement is demonstrated by utilizing strong field ionization of H2 gas for transmission gating. A cross-propagating intense near-IR gate pulse ionizes the EUV absorbing H2 molecules into EUV-non-absorbing H2++ (two protons) and creates a time sweep of transmission encoded spatially across the EUV pulse. The temporal envelope is then retrieved from the lopsided spatial profile of the transmitted pulse. This method not only measures EUV temporal envelope for each single shot, but also determines timing jitter and envelope fluctuation statistically, thus is particularly useful for characterizing low-repetition-rate fluctuating EUV/soft x-ray sources. 其他題名： Opt Express 出版者： United States 出版日期： 2015-12-28 出處： Optics express, 2015-12, Vol.23 (26), p.34082-34092 資源來源： Optica Publishing Group Journals 識別號： ISSN: 1094-4087 識別號： EISSN: 1094-4087 識別號： DOI: 10.1364/OE.23.034082 識別號： PMID: 26832064
