Multibit retention registers for power gated designs: Concept, design, and deployment

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Title:	Multibit retention registers for power gated designs: Concept, design, and deployment
Authors:	陳聿廣;Chen, Yu-Guang;Geng, Hui;Lai, Kuan-Yu;Shi, Yiyu;Chang, Shih-Chieh
Contributors:	資訊電機學院電機工程學系
Keywords:	Algorithm design and analysis;Algorithms;Clocks;Computer aided design;Delays;Design engineering;Latches;Leakage;Logic gates;Low power;mode transition latency;multibit retention register;power gating;Product development;Registers;Retention;Sleep;Stores;Transistors
Date:	2014-01-01
Issue Date:	2026-04-23 14:26:36 (UTC+8)
Publisher:	Institute of Electrical and Electronics Engineers Inc.;New York: IEEE
Abstract:	摘要： Retention registers have been widely used in power gated designs to store data during sleep mode. However, their excessive area and leakage power render it imperative to minimize the total retention storage size. The current industry practice replaces all registers with singlebit retention ones, which significantly limits the design freedom and yields suboptimal designs. Toward this, for the first time in the literature, we propose the concept and the design of multibit retention registers, with which only selected registers need to be replaced. The technique can significantly reduce the number of bits that need to be stored and thus the leakage power, but needs several clock cycles for mode transition. In addition, an efficient assignment algorithm is developed to minimize the total retention storage size subject to mode transition latency constraint. Experimental results show that our framework on average can reduce the leakage power in sleep mode by 84% along with additional mode transition latency of 6 to 11 clock cycles, compared with the singlebit retention register-based design. 其他題名： TCAD 出版者： New York: IEEE 出版日期： 2014-04-01 出處： IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2014-04, Vol.33 (4), p.507-518 資源來源： IEEE Xplore 版權： Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Apr 2014 識別號： ISSN: 0278-0070 識別號： EISSN: 1937-4151 識別號： DOI: 10.1109/TCAD.2013.2293881 識別號： CODEN: ITCSDI
Appears in Collections:	[Department of Electrical Engineering] journal & Dissertation

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