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    题名: Strain-controlled of compressive/tensile Ge epilayers on Si by electron cyclotron resonance chemical vapor deposition
    作者: 鄭劭家;Kuo, Wei-Cheng;Lin, Chao-Yu;Lee, Chien-Chieh;Cheng, Chao-Chia;Chang, Jenq-Yang
    贡献者: 理學院物理學系
    日期: 2016-01-01
    上传时间: 2026-04-23 14:27:30 (UTC+8)
    出版者: Electrochemical Society, Inc.;The Electrochemical Society
    摘要: 摘要: In this study, we use electron cyclotron resonance chemical vapor deposition to investigate the strain behavior in Ge epilayers grown on silicon at a low temperature of 220°C. The strain in the Ge epilayers is transformed from compressive (−0.567%) to tensile (0.15%) as the process pressure decreases and main coil current increases. This tensile strain is due to intrinsic stress in the Ge epilayers at high process pressure and low main coil current. Besides, the Ge atoms have higher kinetic energy and shorter mean free path at low process pressure and high main coil current, which causes atomic bombardment effect on the Ge surfaces frequently. Thus, the intrinsic stress in Ge epilayers become compressive. The absorption coefficient of tensile and compressive strain in Ge films are measured using a UV-VIS-NIR spectrophotometer. The results show the absorption coefficients of the tensile strain Ge epilayer has a redshift condition on the absorption edge compare with compressive strain Ge epilayers. Finally, the structure information of the Ge epilayers is identified by atomic force microscopy and transmission electron microscopy. This strain control technology is modulated by film growth parameter, which can adjust the Ge bandgap for the device requirement.
    其他題名: ECS J. Solid State Sci. Technol
    出版者: The Electrochemical Society
    出版日期: 2016-01
    出處: ECS journal of solid state science and technology, 2016-01, Vol.5 (9), p.P529-P533
    版權: 2016 The Electrochemical Society
    識別號: ISSN: 2162-8769
    識別號: EISSN: 2162-8769
    識別號: EISSN: 2162-8777
    識別號: DOI: 10.1149/2.0351609jss
    显示于类别:[物理學系] 期刊論文

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