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    Please use this identifier to cite or link to this item: https://ir.lib.ncu.edu.tw/handle/987654321/108248


    Title: Single-mode vertical-cavity surface-emitting laser array with high power and narrow far-field divergence angle
    Authors: 許晉瑋;Shi, Jin-Wei;Chi, Kai-Lun;Chang, Jin-Hao;Wei, Zhi-Rui;Jiang, Jia-Wei;Yang, Ying-Jay
    Contributors: 資訊電機學院電機工程學系
    Keywords: Arrays;Current measurement;laser beam combing;Periodic structures;Power generation;Semiconductor lasers;Temperature measurement;Vertical cavity surface emitting lasers
    Date: 2013-11-29
    Issue Date: 2026-04-23 14:40:23 (UTC+8)
    Publisher: Institute of Electrical and Electronics Engineers Inc.;IEEE
    Abstract: 摘要: We demonstrate novel structures of an 850-nm vertical-cavity surface-emitting laser (VCSEL) array for high output power, single-lobe far-field pattern, and narrow divergence angle. By using the Zn-diffusion process with proper sizes of oxide-current-confined and Zn-diffusion apertures, each unit of VCSEL in the demonstrated array is highly single-mode (side-mode suppression ratio > 30 dB) with a narrow far-field divergence angle (9^{\circ} - 10^{\circ}) and high maximum single-mode output power ( \sim 6.3 mW). Due to the high uniformity of single-mode performance of each VCSEL unit, the 6 \times 6 array exhibits an excellent lasing phenomenon, which includes single-lobe far-field pattern, weak in-phase coupling, narrowing of divergence angle (from 9 ^{\circ} to 4 ^{\circ} ), and output power as high as around 104 mW. Furthermore, by measuring the bias-dependent output optical spectra in different positions of our array, the high similarity of these spectra indicates the excellent uniformity of our fabrication process for single-mode VCSEL.
    其他題名: JPHOT
    出版者: IEEE
    出版日期: 2013-12-01
    出處: IEEE photonics journal, 2013-12, Vol.5 (6), p.1502508-1502508
    資源來源: IEEE Xplore
    識別號: ISSN: 1943-0655
    識別號: ISSN: 1943-0647
    識別號: EISSN: 1943-0647
    識別號: DOI: 10.1109/JPHOT.2013.2287559
    識別號: CODEN: PJHOC3
    Appears in Collections:[Department of Electrical Engineering] journal & Dissertation

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