Adaptive optics assisted in-process monitoring system of surface roughness of titanium Ti-GR-2

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题名:	Adaptive optics assisted in-process monitoring system of surface roughness of titanium Ti-GR-2
作者:	傅尹坤;Lai, Zheng-Hong;Fuh, Yiin-Kuen;Chen, Pin-Wen
贡献者:	工學院機械工程學系
关键词:	Adaptive optics;Scattering;Surface roughness;Ti-GR-2
日期:	2016-02-01
上传时间:	2026-04-23 14:41:17 (UTC+8)
出版者:	Urban und Fischer Verlag Jena;Elsevier GmbH
摘要:	摘要： Titanium has received extensive application over the past century due to extraordinary properties such as high ratio of strength-to-density, excellent modulus of elasticity, and excellent corrosion resistance. In particular, Ti-GR-2 and related titanium alloys are recognized as a biocompatible material and routinely used in many artificially implanted structures such as femoral hip joints and artificial teeth. It is widely known that the surface roughness of metallic alloys may potentially affect many aspects of cell attachment, proliferation and differentiation. Therefore, this paper presents an aberration correction scheme by adaptive optics (AO) to facilitate the rapid and in-situ measurement of surface roughness. In experimental setup, by combining an optical probe of laser-scattering phenomena and AO methodology, Ti-GR-2 samples with a roughness values ranging from 0.08 to 0.274μm demonstrate excellent correlation (determination coefficient, R2, ∼0.9849, error values ∼5.61%) between the peak power and average roughness. The measurement results of proposed AO-assisted system are consistently performed agree well with the stylus method. For the metallic alloys such as Ti-GR-2 materials, the precise and stable measurement of roughness in the manufacturing processes is of great importance. Therefore, a rapid in-process and in-situ roughness monitor/estimator is highly desirable and beneficial based on the proposed AO-assisted method. 出版者： Elsevier GmbH 出版日期： 2016-02-01 出處： Optik (Stuttgart), 2016-02, Vol.127 (4), p.2274-2277 資源來源： ScienceDirect (Elsevier) Journals 版權： 2015 Elsevier GmbH 識別號： ISSN: 0030-4026 識別號： EISSN: 1618-1336 識別號： DOI: 10.1016/j.ijleo.2015.11.151
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