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    請使用永久網址來引用或連結此文件: https://ir.lib.ncu.edu.tw/handle/987654321/108292


    題名: Strong wavelength detuning of 850 nm vertical-cavity surface-emitting lasers for high-speed (>40 Gbit/s) and low-energy consumption operation
    作者: 許晉瑋;Chi, Kai-Lun;Yen, Jia-Liang;Wun, Jhih-Min;Jiang, Jia-Wei;Lu, I-Cheng;Chen, Jason;Yang, Ying-Jay;Shi, Jin-Wei
    貢獻者: 資訊電機學院電機工程學系
    關鍵詞: Apertures;Bandwidth;Current measurement;Frequency measurement;Performance evaluation;Resistance;Semiconductor lasers;Vertical cavity surface emitting lasers
    日期: 2015-11-01
    上傳時間: 2026-04-23 14:41:58 (UTC+8)
    出版者: Institute of Electrical and Electronics Engineers Inc.;IEEE
    摘要: 摘要: The strong (>20 nm) wavelength detuning technique has been demonstrated to enhance the modulation speed and high-temperature characteristics (at 85 °C), as well as lower the required driving current density performance of oxide-relief 850-nm vertical-cavity surface-emitting lasers (VCSELs) for >40 Gbit/s operation. By increasing the wavelength detuning from 15 to 20 nm, a significant improvement in the electrical-to-optical (E-O) bandwidth (20 to 27 GHz) of the VCSEL can be observed. This detuning design (~20 nm) is incorporated along with a Zn-diffusion structure into our oxide-relief VCSEL with a miniaturized oxide-relief aperture (~3 μm). Highly single-mode, high-speed (26 GHz) operation, and moderate differential resistance (100 Ω) values can be simultaneously achieved. In addition, it is found that devices with a further larger detuning wavelength (>20 nm) and enlarged oxide-relief apertures (~8 μm) can sustain the same maximum E-O bandwidth (26 GHz) as that of a miniaturized (~3 μm) VCSEL, resulting in the lower driving current density (8 versus 18.8 kA/cm 2 ) required for high-speed performance. Excellent transmission performance, which includes an extremely low energy-to-data rate ratio (EDR: 228 fJ/bit; over 100 m OM4 fiber) and record-low driving-current density (8 kA/cm 2 ; 3.5 mA) has been successfully achieved for 41 Gbit/s error-free transmission for these VCSELs.
    其他題名: JSTQE
    出版者: IEEE
    出版日期: 2015-11
    出處: IEEE journal of selected topics in quantum electronics, 2015-11, Vol.21 (6), p.470-479
    資源來源: IEEE Electronic Library (IEL)
    識別號: ISSN: 1077-260X
    識別號: EISSN: 1558-4542
    識別號: DOI: 10.1109/JSTQE.2015.2451015
    識別號: CODEN: IJSQEN
    顯示於類別:[電機工程學系] 期刊論文

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