Testing and diagnosing comparison faults of TCAMs with asymmetric cells

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Title:	Testing and diagnosing comparison faults of TCAMs with asymmetric cells
Authors:	李進福;Li, Jin-Fu
Contributors:	資訊電機學院電機工程學系
Keywords:	Algorithms;Arrays;Asymmetry;comparison fault;content addressable memory (CAM);Content management;Diagnosis;Digital systems;Encoders;Fault detection;Faults;march test;Mathematical models;Memory management;Memory testing;Studies;ternary CAM
Date:	2012-10-16
Issue Date:	2026-04-23 14:46:10 (UTC+8)
Publisher:	IEEE Computer Society;New York: IEEE
Abstract:	摘要： Ternary content addressable memory (TCAM) is a key component in various digital systems due to its fast lookup operation. Symmetric and asymmetric TCAM cells are two widely used cells for implementing a TCAM array. This paper presents several comparison fault models of TCAMs with asymmetric cells based on electrical defects. Some new comparison faults which do not exist in a TCAM with symmetric cells are found. One march-like test algorithm T AC-H is also proposed to cover the defined comparison faults. The T AC-H consists of 8N Write operations and (3N + 2B) Compare operations for an N × B-bit TCAM with Hit output only. We also propose two march-like diagnosis algorithms to identify the defined comparison faults of TCAMs with asymmetric cells. The first diagnosis algorithm D AC-H requires 5N Write operations, 3N Erase operations, and (5N + 2B) Compare operations to distinguish 100 percent comparison faults for a TCAM with Hit output only. The second diagnosis algorithm D AC-P requires 3N Write operations, 1N Erase operations, and (5N + 2B) Compare operations to distinguish 100 percent comparison faults for a TCAM with Hit and priority address encoder outputs. 其他題名： TC 出版者： New York: IEEE 出版日期： 2012-11-01 出處： IEEE transactions on computers, 2012-11, Vol.61 (11), p.1576-1587 資源來源： IEEE Electronic Library (IEL) 版權： Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Nov 2012 識別號： ISSN: 0018-9340 識別號： EISSN: 1557-9956 識別號： DOI: 10.1109/TC.2011.196 識別號： CODEN: ITCOB4
Appears in Collections:	[Department of Electrical Engineering] journal & Dissertation

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