Upgrade of beamline BL08B at Taiwan Light Source from a photon-BPM to a double-grating SGM beamline

Please use this identifier to cite or link to this item: https://ir.lib.ncu.edu.tw/handle/987654321/108418

Title:	Upgrade of beamline BL08B at Taiwan Light Source from a photon-BPM to a double-grating SGM beamline
Authors:	陳俞融;Yuh, Jih-Young;Lin, Shan-Wei;Huang, Liang-Jen;Fung, Hok-Sum;Lee, Long-Life;Chen, Yu-Joung;Cheng, Chiu-Ping;Chin, Yi-Ying;Lin, Hong-Ji
Contributors:	理學院物理學系
Keywords:	Experiments;extreme ultraviolet (EUV);photon beam-position monitor (BPM);soft X-rays;Solar physics;Spectrum analysis;spherical-grating monochromator (SGM) beamline;Taiwan Light Source;X-rays
Date:	2015-09-01
Issue Date:	2026-04-23 14:47:19 (UTC+8)
Publisher:	International Union of Crystallography;5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of Crystallography
Abstract:	摘要： During the last 20 years, beamline BL08B has been upgraded step by step from a photon beam‐position monitor (BPM) to a testing beamline and a single‐grating beamline that enables experiments to record X‐ray photo‐emission spectra (XPS) and X‐ray absorption spectra (XAS) for research in solar physics, organic semiconductor materials and spinel oxides, with soft X‐ray photon energies in the range 300–1000 eV. Demands for photon energy to extend to the extreme ultraviolet region for applications in nano‐fabrication and topological thin films are increasing. The basic spherical‐grating monochromator beamline was again upgraded by adding a second grating that delivers photons of energy from 80 to 420 eV. Four end‐stations were designed for experiments with XPS, XAS, interstellar photoprocess systems (IPS) and extreme‐ultraviolet lithography (EUVL) in the scheduled beam time. The data from these experiments show a large count rate in core levels probed and excellent statistics on background normalization in the L‐edge adsorption spectrum. 其他題名： Jnl of Synchrotron Radiation 出版者： 5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of Crystallography 出版日期： 2015-09-01 出處： Journal of synchrotron radiation, 2015-09, Vol.22 (5), p.1312-1318 資源來源： Alma/SFX Local Collection 版權： International Union of Crystallography, 2015 識別號： ISSN: 1600-5775 識別號： ISSN: 0909-0495 識別號： EISSN: 1600-5775 識別號： DOI: 10.1107/S1600577515014009 識別號： PMID: 26289286
Appears in Collections:	[Department of Physics] journal & Dissertation

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