Block copolymer alignment method for mobility anisotropy and enhancement of poly(3-hexylthiophene) thin-film transistors

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Title:	Block copolymer alignment method for mobility anisotropy and enhancement of poly(3-hexylthiophene) thin-film transistors
Authors:	何正榮;Cheng, J.-W. John;Ho, Jeng-Rong;Tseng, Yu-Wei;Su, Hung-Jie;Chien, Chi-Horng;Tsiang, Raymond C.-C.;Hsu, Chia Chen;Chen, Ting-Ray;Chiang, Cheng-Yi
Contributors:	工學院機械工程學系
Keywords:	Anisotropy;Annealing;Applied sciences;Block copolymers;Copolymers;Exact sciences and technology;Identification and classification;Materials;Morphology;Physicochemistry of polymers;Polymer industry, paints, wood;Production processes;Properties;Scanning electron microscopy;Technology of polymers;Thin film devices;Thin films;Transistors
Date:	2012-12-01
Issue Date:	2026-04-23 14:47:20 (UTC+8)
Publisher:	John Wiley and Sons Inc.;Hoboken: Wiley Subscription Services, Inc., A Wiley Company
Abstract:	摘要： In this article, a new alignment‐layer approach based on block copolymers (BCPs) is proposed for mobility anisotropy and enhancement of organic thin‐film transistors (OTFTs). In particular, the poly(3‐hexylthiophene) (P3HT) TFT with polystyrene‐block‐poly(methyl methacrylate) alignment layer was studied. With max dichroic ratio 1.23 in polarized absorption spectra of P3HT and corresponding device mobility anisotropy 4.63, taking place at the highest annealing temperature of 230°C, the BCP alignment approach proved to be an effective tool for orientation control of polymers such as the P3HT. However, because of negative effect of thermal annealing that causes twisting in P3HT backbones, the achieved mobility enhancement was only a meager 41%. Nevertheless, with rich varieties in the composition and complexity of BCPs, the proposed BCP alignment design represents an interesting alternative to existing alignment approaches to orientation control of P3HT and mobility anisotropy and enhancement of the resultant OTFTs. Besides, the phase‐alternate surface morphology of the BCP alignment layer was confirmed through a series of atomic force microscopy, X‐ray photoelectron microscopy, and field‐emission scanning electron microscopy. POLYM. ENG. SCI., 2012. © 2012 Society of Plastics Engineers 其他題名： Polym Eng Sci 出版者： Hoboken: Wiley Subscription Services, Inc., A Wiley Company 出版日期： 2012-12 出處： Polymer engineering and science, 2012-12, Vol.52 (12), p.2581-2587 資源來源： Wiley Online Library Journals 版權： Copyright © 2012 Society of Plastics Engineers 版權： 2014 INIST-CNRS 版權： COPYRIGHT 2012 Society of Plastics Engineers, Inc. 版權： Copyright Blackwell Publishing Ltd. Dec 2012 識別號： ISSN: 0032-3888 識別號： EISSN: 1548-2634 識別號： DOI: 10.1002/pen.23220 識別號： CODEN: PYESAZ
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