Thermally induced variations of strain condition and emission behavior in flat and bendable lightemitting diodes on different substrates

NCUIR > College of Electrical Engineering & Computer Science > Department of Electrical Engineering > journal & Dissertation > Item 987654321/108431

Please use this identifier to cite or link to this item: https://ir.lib.ncu.edu.tw/handle/987654321/108431

Title:	Thermally induced variations of strain condition and emission behavior in flat and bendable lightemitting diodes on different substrates
Authors:	姚毓峰;Lin, Chun-Han;Su, Chia-Ying;Zhu, Erwin;Hsieh, Chieh;Tu, Charng-Gan;Yao, Yu-Feng;Chen, Hao-Tsung;Liao, Che-Hao;Chen, Horng-Shyang;Kiang, Yean-Woei;Yang, C. C.
Contributors:	資訊電機學院電機工程學系
Date:	2015-06-15
Issue Date:	2026-04-23 14:48:13 (UTC+8)
Publisher:	The Optical Society;United States
Abstract:	摘要： The emission behaviors of four light-emitting diodes (LEDs) of different substrate structures, including a lateral LED grown on sapphire, a vertical LED wafer-bonded onto Si (111), a bendable LED Ag-epoxied onto a flat metal, and another bendable LED Ag-epoxied onto a metal of a curved surface, under different duty cycles of current injection are compared. Their different variation trends of emission behavior with injection duty cycle are attributed to the different thermally-induced strain conditions in the epitaxial layers, which are controlled by their substrate structures, in increasing injection duty cycle or current level. The results of Raman scattering measurements during LED operation show that a stronger tensile strain is generated under heating for reducing the quantum-confined Stark effect and hence increasing emission efficiency when the epitaxial layer is not tightly bonded onto a hard substrate. Such a behavior is particularly stronger when the epitaxial layer is bent. 其他題名： Opt Express 出版者： United States 出版日期： 2015-06-15 出處： Optics express, 2015-06, Vol.23 (12), p.15491 資源來源： Optica Publishing Group Journals 識別號： ISSN: 1094-4087 識別號： EISSN: 1094-4087 識別號： DOI: 10.1364/OE.23.015491 識別號： PMID: 26193529
Appears in Collections:	[Department of Electrical Engineering] journal & Dissertation

Files in This Item:

File	Description	Size	Format
index.html		0Kb	HTML	13	View/Open

社群 sharing

Loading...