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    請使用永久網址來引用或連結此文件: https://ir.lib.ncu.edu.tw/handle/987654321/108815


    題名: Enhanced sensitivity to surface plasmon resonance phase in wavelength-modulated heterodyne interferometry
    作者: 李朱育;Lee, Ju-Yi;Mai, Li-Wei;Hsu, Cheng-Chih;Sung, Yuan-Yuan
    貢獻者: 工學院機械工程學系
    關鍵詞: Interferometry;Light sources;Monitoring;Plasmons;Refractive index;Refractivity;Sensors;Surface plasmon resonance;Wavelength-modulated heterodyne interferometry
    日期: 2013-02-15
    上傳時間: 2026-04-23 15:08:13 (UTC+8)
    出版者: Elsevier;Elsevier B.V
    摘要: 摘要: An alternative wavelength-modulated heterodyne interferometry based on surface plasmon resonance is proposed for in-situ monitoring of variations in the refractive index of a test sample. Phase variations in surface plasmon resonance are detected by the heterodyne detection system, which uses a wavelength-modulated light source and an unequal-path-length optical configuration. The measurement sensitivity and resolution of the refractive index are greatly enhanced by inserting a quarter-wave plate with a suitable azimuthal angle in front of the SPR sensor. The experimental results indicate that the resolution is better than 3×10−7RIU.
    出版者: Elsevier B.V
    出版日期: 2013-02-15
    出處: Optics communications, 2013-02, Vol.289, p.28-32
    資源來源: Elsevier ScienceDirect Journals Complete
    版權: 2012 Elsevier B.V.
    識別號: ISSN: 0030-4018
    識別號: EISSN: 1873-0310
    識別號: DOI: 10.1016/j.optcom.2012.10.005
    顯示於類別:[機械工程學系] 期刊論文

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