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    Please use this identifier to cite or link to this item: https://ir.lib.ncu.edu.tw/handle/987654321/109048


    Title: Sharpening Si nanocrystals on the bulk surface by nanoscale electrochemistry through controlling the hole current with the irradiation of near-infrared laser
    Authors: 李天錫;Chiang, C. C.;Lee, T.-H.
    Contributors: 工學院機械工程學系
    Date: 2016-01-01
    Issue Date: 2026-04-23 15:27:31 (UTC+8)
    Publisher: Electrochemical Society, Inc.;The Electrochemical Society
    Abstract: 摘要: Numerous Si nanocrystals on the bulk surface can be efficiently sharpened by a HF-based electrochemical etching with the irradiation of near-infrared (NIR) laser simultaneously. Under the NIR laser-irradiation, the electrons excited from the B-Si complex inhibited the growth of the anodized layer and promoted the formation of nanocrystals by controlling the number of holes that participate in anodization. The effect of NIR laser-irradiation enhanced the photoluminescence by 7-10 times as compared to that obtained when anodization was performed in the dark for growing a normal porous silicon. The transmission electron microscopy images showed clearly that that nanocrystals (<3 nm) were embedded at the interface of the bulk surface and the anodized layer.
    其他題名: J. Electrochem. Soc
    出版者: The Electrochemical Society
    出版日期: 2016-01
    出處: Journal of the Electrochemical Society, 2016-01, Vol.163 (9), p.E258-E262
    資源來源: Institute of Physics Journals
    版權: The Author(s) 2016. Published by ECS.
    識別號: ISSN: 0013-4651
    識別號: ISSN: 1945-7111
    識別號: EISSN: 1945-7111
    識別號: DOI: 10.1149/2.0531609jes
    Appears in Collections:[Departmant of Mechanical Engineering ] journal & Dissertation

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