摘要： A theoretical approach of using dark lock-in thermography (DLIT) to resolve series and shunt resistance spatial distribution of a solar cell is derived. The resistance distribution can be represented as a simple function of DLIT temperature amplitude and phase distribution under small signal approximation. DLIT experiment using different solar cells was performed and obtained the temperature amplitude and phase images along with the corresponding resistance images. 出版者： Melville: American Institute of Physics 出版日期： 2014-01-21 出處： Journal of applied physics, 2014-01, Vol.115 (3) 資源來源： AIP Journals (American Institute of Physics) 版權： 2014 AIP Publishing LLC. 識別號： ISSN: 0021-8979 識別號： EISSN: 1089-7550 識別號： DOI: 10.1063/1.4862297
