厚度或折射率變異對窄帶通濾光片之可靠度分析; The analysis of reliability for narrow-band-pass filter as the layer thickness or/and material refractive index being statistical varied

NCUIR > Engineering College > Graduate Institute of Mechanical Engineering > Electronic Thesis & Dissertation > Item 987654321/2192

Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/2192

Title:	厚度或折射率變異對窄帶通濾光片之可靠度分析;The analysis of reliability for narrow-band-pass filter as the layer thickness or/and material refractive index being statistical varied
Authors:	龔志偉;Chih-Wei Kung
Contributors:	機械工程研究所
Keywords:	光學薄膜;可靠度;折射率;refractive index;reliability;optical thin film
Date:	2002-07-04
Issue Date:	2009-09-21 11:40:30 (UTC+8)
Publisher:	國立中央大學圖書館
Abstract:	隨著高科技產業的發展，光學薄膜應用於日常生活中已是隨手可見，而對於其品質的要求也愈來愈高，從設計、鍍製到組裝成品，都應保有相當水準的品質，設計部分是屬於規格方面的問題，可以用理論使其趨於完善；而鍍製及組裝方面有涉及製造中人為主觀因素及環境客觀因素的影響，因此變異的存在是無法避免的，本文以可靠度的觀點從製程上的變異去分析一濾光片受到外界環境的影響，並試著探討其輸出特性的變化與各變異之間的關係。本文的主要架構，以光學薄膜特徵矩陣配合蒙地卡羅模擬法，考慮在不同的變異、不同的膜層層數及不同的腔數下，濾光片的可靠度變化情形。 In this thesis the reliability of narrow-band-pass filter is investigated. Since during the coating process either or both of the layer thickness and material refractive index are considered to be statistical varied. In the study it is found that there exists as least a minimum numbers of layers above which the function of narrow-band-pass filter can be guaranteed. Such number of layers depends on the statistical variance of thickness or/and refractive index. However as the variance becomes large there may not exists such minimum layers.
Appears in Collections:	[Graduate Institute of Mechanical Engineering] Electronic Thesis & Dissertation

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