中大機構典藏-NCU Institutional Repository-提供博碩士論文、考古題、期刊論文、研究計畫等下載:Item 987654321/26916
English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 78852/78852 (100%)
造訪人次 : 37994185      線上人數 : 720
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
搜尋範圍 查詢小技巧:
  • 您可在西文檢索詞彙前後加上"雙引號",以獲取較精準的檢索結果
  • 若欲以作者姓名搜尋,建議至進階搜尋限定作者欄位,可獲得較完整資料
  • 進階搜尋


    請使用永久網址來引用或連結此文件: http://ir.lib.ncu.edu.tw/handle/987654321/26916


    題名: Effects of SiCp reinforcement by electroless copper plating on properties of Cu/SiCp composites
    作者: Lee,YF;Lee,SL;Chuang,CL;Lin,JC
    貢獻者: 機械工程研究所
    關鍵詞: METAL-MATRIX COMPOSITES;CORROSION BEHAVIOR;FABRICATION;ALUMINUM
    日期: 1999
    上傳時間: 2010-06-29 18:03:12 (UTC+8)
    出版者: 中央大學
    摘要: Silicon carbide reinforced copper matrix composites containing 50-80 vol.-%SiCp were fabricated by hot pressing copper coated SIG, powder. The results show that the densification, thermal expansion coefficients, flexural strength, and thermal conductivity of Cu/SiCp composites reinforced by electroless copper plating and their corrosion resistance in 5%NaCl solution are better than those without electroless plating. Physical properties and flexural strength of the composites decrease with an increase in SIG, content, whereas the corrosion resistance increases with an increase in SiCp volume fraction. By observing the Fracture surface after a flexural test, it can be seen there are two types of fracture model: the cracking of Cu/SiCp interface and the pulling out of SiCp particles. The experiment also proved that the bonding strength of the Cu/SiCp interface and the pressure of the hot pressing operation are the two main factors which influence the fracture of these composites.
    關聯: POWDER METALLURGY
    顯示於類別:[機械工程研究所] 期刊論文

    文件中的檔案:

    檔案 描述 大小格式瀏覽次數
    index.html0KbHTML499檢視/開啟


    在NCUIR中所有的資料項目都受到原著作權保護.

    社群 sharing

    ::: Copyright National Central University. | 國立中央大學圖書館版權所有 | 收藏本站 | 設為首頁 | 最佳瀏覽畫面: 1024*768 | 建站日期:8-24-2009 :::
    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - 隱私權政策聲明