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    Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/27280

    Title: Reduced impact ionization by using In-0.53(AlxGa1-x)(0.47)As (x=0.1,0.2) channel in InP HEMTs
    Authors: Lai,LS;Chan,YJ;Pan,JW;Sheih,JL;Chyi,JI
    Contributors: 環境工程研究所
    Keywords: TRANSISTORS
    Date: 1997
    Issue Date: 2010-06-29 18:21:54 (UTC+8)
    Publisher: 中央大學
    Abstract: In0.52Al0.48As/In0.53Ga0.47As high electron mobility transistors (HEMTs) lattice-matched to InP substrates have achieved a great successful role on microwave devices and circuits. However, a significant kink effect is observed in I-V characteristics. This kink effect together with a high output conductance is associated with a higher impact ionization rate in the InGaAs channel, which deteriorates the device performance. Due to this disadvantage of low energy bandgap InGaAs channel, in this study, we added a small amount of Al into the InGaAs channel to enhance the bandgap, and expect a reduction of impact ionization process. In the mean while, the life-time testing associated device performance could also be improved.
    Appears in Collections:[環境工程研究所 ] 期刊論文

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