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    題名: Goodness of fit tests with misclassified data
    作者: Cheng,KF;Hsueh,HM;Chien,TH
    貢獻者: 統計研究所
    關鍵詞: DOUBLE SAMPLING SCHEME;BINOMIAL DATA
    日期: 1998
    上傳時間: 2010-06-29 19:33:42 (UTC+8)
    出版者: 中央大學
    摘要: The most popular goodness of fit test for a multinomial distribution is the chi-square test. But this test is generally biased if observations are subject to misclassification. In this paper we shall discuss how to define a new test procedure when we have double sample data obtained from the true and fallible devices. An adjusted chi-square test based on the imputation method and the likelihood ratio test are considered. Asymptotically, these two procedures are equivalent. However, an example and simulation results show that the former procedure is not only computationally simpler but also more powerful under finite sample situations.
    關聯: COMMUNICATIONS IN STATISTICS-THEORY AND METHODS
    顯示於類別:[統計研究所] 期刊論文

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