High thermal conductive passivation films on AlGaAs/GaAs heterojunction diodes and bipolar transistors

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题名:	High thermal conductive passivation films on AlGaAs/GaAs heterojunction diodes and bipolar transistors
作者:	Hwang,HP;Cheng,YS;Shieh,JL;Pan,JW;Chyi,JI
贡献者:	電機工程研究所
关键词:	SURFACE
日期:	1997
上传时间:	2010-06-29 20:21:23 (UTC+8)
出版者:	中央大學
摘要:	The de characteristics of GaAs/Al0.3Ga0.7As heterostructure diodes and heterojunction bipolar transistors (HBTs) passivated by various Si-based thin films, i.e. amorphous Si, SiC, as well as the conventional SiOx and SiNx, were investigated and compared. All these films were found effective in reducing the leakage current and long term degradation. Less size-dependent on the current gain for the passivated HBTs by amorphous Si and SiC was observed. In addition, the devices passivated by amorphous Si and SiC films exhibited more stable characteristics during high power operation, which were indicated by the unchanged junction voltage in the diodes and the stable microwave performance in the HBTs. These de and thermal properties of the passivated devices demonstrate the potential of SiC and amorphous Si as excellent passivation materials for power devices.
關聯:	COMPOUND SEMICONDUCTORS 1996
显示于类别:	[電機工程研究所] 期刊論文

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