Scanning electron filling modulation reflectance of charged InGaAs self-assembled quantum dot

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Title:	Scanning electron filling modulation reflectance of charged InGaAs self-assembled quantum dot
Authors:	Hsu,TM;Chang,WH;Lai,CY;Yeh,NT;Chyi,JI
Contributors:	電機工程研究所
Keywords:	SPECTROSCOPY
Date:	2002
Issue Date:	2010-07-06 18:32:12 (UTC+8)
Publisher:	中央大學
Abstract:	We present the scanning electron-filling modulation reflectance (SEFR) of charged In0.5Ga0.5As self-assembled quantum dots. The SEFR is performed by applying a small constant modulation voltage and scanning the dc bias through the quantum dot energy level
Relation:	JOURNAL OF APPLIED PHYSICS
Appears in Collections:	[Graduate Institute of Electrical Engineering] journal & Dissertation

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