Fault diagnosis for linear analog circuits

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Title:	Fault diagnosis for linear analog circuits
Authors:	Lin,JW;Lee,CL;Su,CC;Chen,JE
Contributors:	電機工程研究所
Date:	2001
Issue Date:	2010-07-06 18:33:37 (UTC+8)
Publisher:	中央大學
Abstract:	This paper presents a novel scheme to diagnose single and double faults for linear analog circuits. The scheme first proposes a simple transformation procedure to transform the tested linear analog circuit into a discrete signal flow graph, then construct
Relation:	JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
Appears in Collections:	[Graduate Institute of Electrical Engineering] journal & Dissertation

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