Improvement of the optical coating process by cutting layers with sensitive monitor wavelengths

NCUIR > Research Center > Thin Film Technology Center > journal & Dissertation > Item 987654321/35682

Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/35682

Title:	Improvement of the optical coating process by cutting layers with sensitive monitor wavelengths
Authors:	Lee,CC;Wu,K;Kuo,CC;Chen,SH
Contributors:	薄膜技術研究中心
Keywords:	FILTERS
Date:	2005
Issue Date:	2010-07-07 15:47:51 (UTC+8)
Publisher:	中央大學
Abstract:	For costly optical coatings, a precise monitoring method is necessary. A new monitoring method based on the selection of the most sensitive monitor wavelength is proposed. The most sensitive monitor wavelength is easy to find by a numerical analysis. The
Relation:	OPTICS EXPRESS
Appears in Collections:	[Thin Film Technology Center] journal & Dissertation

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