Scanning tunneling microscopy study of growth of Pt nanoclusters on thin film Al2O3/NiAl(100)

NCUIR > Research Center > Center for Complex Systems > journal & Dissertation > Item 987654321/35779

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Title:	Scanning tunneling microscopy study of growth of Pt nanoclusters on thin film Al2O3/NiAl(100)
Authors:	Sartale,S. D.;Shiu,H. W.;Ten,M. H.;Huang,J. Y.;Luo,M. F.
Contributors:	複雜系統研究中心
Keywords:	OXIDE-FILMS;CLUSTERS;ALUMINA;ALPHA-AL2O3(0001);NIAL(001);PARTICLES;OXIDATION;NIAL(100);DEPOSITS;ION
Date:	2006
Issue Date:	2010-07-07 15:51:02 (UTC+8)
Publisher:	中央大學
Abstract:	The growth of Pt nanoclusters on thin film Al2O3 grown on NiAl(100) was studied by using scanning tunneling microscopy (STM). The samples were prepared by vapor depositing various amounts of Pt onto the Al2O3/NiAl(100) at different substrate temperatures
Relation:	SURFACE SCIENCE
Appears in Collections:	[Center for Complex Systems] journal & Dissertation

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