傾斜效應於粗糙表面背向散射及輻射率之研究 ; Relief Effect on Backscattering and Emissivity from Rough Surface

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Title:	傾斜效應於粗糙表面背向散射及輻射率之研究;Relief Effect on Backscattering and Emissivity from Rough Surface
Authors:	陳冠良;Kuan-Liang Chen
Contributors:	遙測科技碩士學位學程
Keywords:	傾斜效應;先進積分方程模型;背向散射;輻射率;relief effect;backscattering;emissivity;advance integral equation model
Date:	2010-07-30
Issue Date:	2010-12-09 14:02:25 (UTC+8)
Publisher:	國立中央大學
Abstract:	近十年來，對於積分方程模型之散射理論之研究已經有許多改進與突破，利用更精密的運算取代原本的近似解，進而改進原本的模型，而新的散射理論模型我們稱為先進積分方程模型(AIEM)。在真實情況下，存在坡度地表所造成的傾斜效應；為了瞭解傾斜效應的影響，本研究將使用先進積分方程模型，並且加入坡度地表的考慮，進而分析傾斜效應所造成的影響。傾斜效應包含兩個角度的影響分別為，傾斜角度和旋轉角度。傾斜角度和旋轉角度會造成入射角度改變以及極化上的轉變，當局部入射角(Local incident angle)角度為0時，為正向入射，此時有最大背向散射值。在本研究中將利用AIEM探討在不同地表參數並且考慮傾斜效應的情況下所估算出的背向散射以及輻射率的影響量。The original integral equation model (IEM) under few simplifying approximations leads to a relatively simple solution, and yet reasonably accurate estimation for the rough surface scattering. However, these approximations also cause the accuracy degradation under some conditions. Attempts to relax some simplifying assumptions have been made in order to improve the accuracy and to extend its validity region, and leads to advanced IEM, called AIEM model. In reality, there exists surface slope that tilts the mean surface away from the sensor and causes the change of microwave scattering and emission. In order to understand the relief effect on microwave scattering and emission of rough surfaces, this thesis uses the AIEM to simulate the scattering and emission from sloping surfaces. The relief effect includes the tilting and rotating. Tilt angle and rotate angle effectively change the local incident angle and thus generate depolarization effects. In this study, we also consider the impacts of different surface parameters such as correlation function, correlation length, and dielectric constant.
Appears in Collections:	[Master of Science Program in Remote Sensing Science and Technology ] Electronic Thesis & Dissertation

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