English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 78818/78818 (100%)
造訪人次 : 34622999      線上人數 : 564
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
搜尋範圍 查詢小技巧:
  • 您可在西文檢索詞彙前後加上"雙引號",以獲取較精準的檢索結果
  • 若欲以作者姓名搜尋,建議至進階搜尋限定作者欄位,可獲得較完整資料
  • 進階搜尋


    請使用永久網址來引用或連結此文件: http://ir.lib.ncu.edu.tw/handle/987654321/49996


    題名: Localized electrochemical deposition of micrometer copper columns by pulse plating
    作者: Lin,JC;Chang,TK;Yang,JH;Chen,YS;Chuang,CL
    貢獻者: 材料科學與工程研究所
    日期: 2010
    上傳時間: 2012-03-27 16:28:28 (UTC+8)
    出版者: 國立中央大學
    摘要: Micrometer copper column fabrication by localized electrochemical deposition (LECD) was investigated in this study. To obtain columns with uniform diameter, compact structure and a smooth surface, LECD conducted in pulse current (PC) mode was better than that conducted in direct current (DC) mode. A micro-reference electrode was used to monitor the potential at the LECD site. Measurement of this potential permitted estimation of the local copper ion concentration resulting from their dynamic consumption by electrochemical reduction and their supply by mass transport. The electroplating current was measured in order to evaluate the rate of electrochemical reduction. The mass-transfer rate of copper ions was estimated using a theoretical calculation based on diffusion The surface morphology and internal structure were significantly affected by this local concentration, which was in turn governed by the electrical voltage and the duty cycle employed. The mechanism for LECD conducted in PC mode is discussed. (C) 2009 Elsevier Ltd All rights reserved
    關聯: ELECTROCHIMICA ACTA
    顯示於類別:[材料科學與工程研究所 ] 期刊論文

    文件中的檔案:

    檔案 描述 大小格式瀏覽次數
    index.html0KbHTML552檢視/開啟


    在NCUIR中所有的資料項目都受到原著作權保護.

    社群 sharing

    ::: Copyright National Central University. | 國立中央大學圖書館版權所有 | 收藏本站 | 設為首頁 | 最佳瀏覽畫面: 1024*768 | 建站日期:8-24-2009 :::
    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - 隱私權政策聲明