以同步輻射次微米X光繞射法分析無鉛材料於三維電子構裝之微銲點與熱電材料模組之應用;Analyses of Pb-free applications in microbumps of 3D-IC and thermoelectric module by synchrotron radiation sub-micron X-ray diffraction

NCU Institutional Repository > 工學院 > 化學工程與材料工程學系 > 研究計畫 > Item 987654321/62345

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题名:	以同步輻射次微米X光繞射法分析無鉛材料於三維電子構裝之微銲點與熱電材料模組之應用;Analyses of Pb-free applications in microbumps of 3D-IC and thermoelectric module by synchrotron radiation sub-micron X-ray diffraction
作者:	吳子嘉
贡献者:	國立中央大學化學工程與材料工程學系
关键词:	物理;材料科技
日期:	2013-12-01
上传时间:	2014-03-17 11:30:38 (UTC+8)
出版者:	行政院國家科學委員會
摘要:	研究期間：10208~10307;This project will investigate the applications of Pb-free solders on the 3 dimensional packaging in the devices and green technology. The researches will be conducted with the aid of synchrotron sub-micron X-ray diffraction technique in Taiwan Photon Source. In 3D-IC, the study will emphasize the impact to the reliability with the shrinking dimensions of the solders. The results can be used to establish the failure mode of the devices. The topic will also cover the influences of the electrical and thermal effect on the kinetics of the interfacial intermetallic compound formation. Tin whisker is also an important issue that can be seen on the surfaces of the microbumps under room temperature storage. The study will discuss the spontaneous growth mechanism and the relation with the stress distribution. The well controlled samples can be utilized to in-situ analyze the fundamental properties of the nucleation and the growth of whiskers. The project will explore the applications of Pb-free solders in the energy related materials. By joining the solders with Bi2Te3 thermal electric materials, the interfacial diffusion barrier is critical to the mechanical reliability. The electromigration test on the systems will yield a systematic analysis of the failure mode.
關聯:	財團法人國家實驗研究院科技政策研究與資訊中心
显示于类别:	[化學工程與材料工程學系 ] 研究計畫

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